XPS

(0)

XPS

XPS Analysis Services (X-ray Photoelectron Spectroscopy):

X-ray photoelectron spectroscopy (XPS) is the use of X-rays to irradiate a sample in or der to stimulate the emission of internal electrons or valence electrons of atoms or molecules. XPS is an imp or tant method f or material surface analysis and is widely used in the analysis of mineral elements in the fields of chemistry, polymer, materials, environment, biology, medicine, pharmacy, agriculture, geology, food, life sciences and etc. is used. A professional reliability third-party testing organization, Kimia Analysis lab you can perform a full range of analysis services according to ISO, ASTM and other standards as well as industry requirements. Welcome to contact our experts for advice.

XPS Device:

XPS Thermofisher ScientifiC K-

The Amount of Sample Required:

20 mg, piece 1 x 1 cm, maximum height 5 mm

Sample return: No

result of XPS Analysis:

xps analysis, kimia analysis, spectroscopy services,

Registration Request XPS Analysis:

To register an XPS analysis request, you can apply through the phone number mentioned in Tel, WhatsApp, Telegram or through our email. Our experts will follow up on your request as soon as possible and send you the required details.
Contact number: +989901397580
Our email: Kimia_analysis@yahoo.com

The Standards We Use in Perf or ming the Analysis:

ASTM E995	Standard Guide f or Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E1523	Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E2108	Standard Practice f or Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ISO 1966	Surface Chemical Analysis — X-Ray Photoelectron Spectroscopy — Estimating and Rep or ting Detection limit s f or Elements in Homogeneous Materials
ISO 16531	Surface Chemical Analysis — Depth Profiling — Methods f or Ion Beam Alignment and the Associated Measurement of Current or Current Density f or Depth Profiling in AES and XPS